"Robust inference for destructive one-shot device test data under Weibull ..."

N. Balakrishnan, Elena Castilla (2024)

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DOI: 10.1016/J.CAM.2023.115452

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type: Journal Article

metadata version: 2023-10-14

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N. Balakrishnan, Elena Castilla:
Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks. J. Comput. Appl. Math. 437: 115452 (2024)

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