"Testfreundlichkeit und Fehlertoleranz in VLSI-Systemen / Testability and ..."

Karl-Erwin Großpietsch (1988)

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DOI: 10.1524/ITIT.1988.30.4.247

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type: Journal Article

metadata version: 2020-05-18

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Karl-Erwin Großpietsch:
Testfreundlichkeit und Fehlertoleranz in VLSI-Systemen / Testability and Fault Tolerance in VLSI-Systems. it Inf. Technol. 30(4): 247-253 (1988)

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