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"Measuring and specifying combinatorial coverage of test input configurations."

D. Richard Kuhn, Raghu N. Kacker, Yu Lei (2016)

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DOI: 10.1007/S11334-015-0266-2

access: closed

type: Journal Article

metadata version: 2021-02-11

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  - https://dblp.org/rec/journals/isse/KuhnKL16
D. Richard Kuhn, Raghu N. Kacker, Yu Lei:
Measuring and specifying combinatorial coverage of test input configurations. Innov. Syst. Softw. Eng. 12(4): 249-261 (2016)

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