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"Interconnect Electromigration Modeling and Analysis for Nanometer ICs: ..."

Sheldon X.-D. Tan, Zeyu Sun, Sheriff Sadiqbatcha (2020)

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DOI: 10.2197/IPSJTSLDM.13.42

access: closed

type: Journal Article

metadata version: 2021-02-19

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Sheldon X.-D. Tan, Zeyu Sun, Sheriff Sadiqbatcha:
Interconnect Electromigration Modeling and Analysis for Nanometer ICs: From Physics to Full-Chip. IPSJ Trans. Syst. LSI Des. Methodol. 13: 42-55 (2020)

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