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"On Delay Test Quality for Test Cubes."

Shinji Oku et al. (2010)

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DOI: 10.2197/IPSJTSLDM.3.283

access: closed

type: Journal Article

metadata version: 2020-09-29

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  - https://dblp.org/rec/journals/ipsj/OkuKSMW10
Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen:
On Delay Test Quality for Test Cubes. IPSJ Trans. Syst. LSI Des. Methodol. 3: 283-291 (2010)

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