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"Towards a tight hardness-randomness connection between permanent and ..."

Maurice Jansen (2012)

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DOI: 10.1016/J.IPL.2012.08.001

access: closed

type: Journal Article

metadata version: 2017-05-26

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Maurice Jansen:
Towards a tight hardness-randomness connection between permanent and arithmetic circuit identity testing. Inf. Process. Lett. 112(24): 969-975 (2012)

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