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"Decision Analysis in Microelectronic Reliability: Optimal Design and ..."

Boaz Ronen, Joseph S. Pliskin (1981)

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DOI: 10.1287/OPRE.29.2.229

access: closed

type: Journal Article

metadata version: 2020-10-26

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Boaz Ronen, Joseph S. Pliskin:
Decision Analysis in Microelectronic Reliability: Optimal Design and Packaging of a Diode Array. Oper. Res. 29(2): 229-242 (1981)

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