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"Sequential Screening in Semiconductor Manufacturing, II: Exploiting ..."

Jihong Ou, Lawrence M. Wein (1996)

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DOI: 10.1287/OPRE.44.1.196

access: closed

type: Journal Article

metadata version: 2020-03-31

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Jihong Ou, Lawrence M. Wein:
Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability. Oper. Res. 44(1): 196-205 (1996)

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