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"A Confidence Interval Procedure for Expected Shortfall Risk Measurement ..."

Hai Lan, Barry L. Nelson, Jeremy Staum (2010)

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DOI: 10.1287/OPRE.1090.0792

access: closed

type: Journal Article

metadata version: 2020-03-31

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Hai Lan, Barry L. Nelson, Jeremy Staum:
A Confidence Interval Procedure for Expected Shortfall Risk Measurement via Two-Level Simulation. Oper. Res. 58(5): 1481-1490 (2010)

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