"Test patterns reordering method based on Gamma distribution."

Wenfa Zhan, Zhiwei Shao (2020)

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DOI: 10.1016/J.VLSI.2019.12.008

access: closed

type: Journal Article

metadata version: 2021-10-14

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Wenfa Zhan, Zhiwei Shao:
Test patterns reordering method based on Gamma distribution. Integr. 72: 66-71 (2020)

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