"A new technique for IDDQ testing in nanometer technologies."

Y. Tsiatouhas et al. (2002)

Details and statistics

DOI: 10.1016/S0167-9260(02)00023-8

access: closed

type: Journal Article

metadata version: 2020-02-20

a service of  Schloss Dagstuhl - Leibniz Center for Informatics