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"Recent advances in EM and BTI induced reliability modeling, analysis and ..."
Sheldon X.-D. Tan et al. (2018)
- Sheldon X.-D. Tan, Hussam Amrouch
, Taeyoung Kim
, Zeyu Sun, Chase Cook, Jörg Henkel:
Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integr. 60: 132-152 (2018)
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