"Low test cost adaptive testing method for high yield IC products."

Yuqi Pan et al. (2025)

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DOI: 10.1016/J.VLSI.2025.102401

access: closed

type: Journal Article

metadata version: 2025-05-09

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Yuqi Pan, Huaguo Liang, Junming Li, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Low test cost adaptive testing method for high yield IC products. Integr. 103: 102401 (2025)

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