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"Failure probability of a FinFET-based SRAM cell utilizing the most ..."

Michail Noltsis et al. (2019)

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DOI: 10.1016/J.VLSI.2018.03.016

access: closed

type: Journal Article

metadata version: 2020-02-20

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Michail Noltsis, Eleni Maragkoudaki, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris:
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point. Integr. 69: 111-119 (2019)

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