"Enumerating catastrophic fault patterns in VLSI arrays with both uni- and ..."

Soumen Maity, Bimal K. Roy, Amiya Nayak (2001)

Details and statistics

DOI: 10.1016/S0167-9260(01)00016-5

access: closed

type: Journal Article

metadata version: 2023-11-12

a service of  Schloss Dagstuhl - Leibniz Center for Informatics