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"Built-in Self-prevention (BISP) for runtime ageing effects of TSVs in 3D ICs."

Dilip Kumar Maity, Surajit Kumar Roy, Chandan Giri (2024)

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DOI: 10.1016/J.VLSI.2023.102088

access: closed

type: Journal Article

metadata version: 2024-01-13

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Dilip Kumar Maity, Surajit Kumar Roy, Chandan Giri:
Built-in Self-prevention (BISP) for runtime ageing effects of TSVs in 3D ICs. Integr. 94: 102088 (2024)

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