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"Reliable techniques for integrated circuit identification and true random ..."

Lawrence T. Clark, James Adams, Keith E. Holbert (2019)

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DOI: 10.1016/J.VLSI.2017.10.001

access: closed

type: Journal Article

metadata version: 2020-02-20

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Lawrence T. Clark, James Adams, Keith E. Holbert:
Reliable techniques for integrated circuit identification and true random number generation using 1.5-transistor flash memory. Integr. 65: 263-272 (2019)

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