"Code-coverage guided prioritized test generation."

J. Jenny Li, David M. Weiss, Howell Yee (2006)

> Home

Details and statistics

DOI: 10.1016/J.INFSOF.2006.06.007

access: closed

type: Journal Article

metadata version: 2021-01-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/infsof/LiWY06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/infsof/LiWY06
J. Jenny Li, David M. Weiss, Howell Yee:
Code-coverage guided prioritized test generation. Inf. Softw. Technol. 48(12): 1187-1198 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.