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"On the adoption of MC/DC and control-flow adequacy for a tight integration ..."
Bo Jiang et al. (2013)
- Bo Jiang, Ke Zhai, W. K. Chan, T. H. Tse, Zhenyu Zhang:
On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization. Inf. Softw. Technol. 55(5): 897-917 (2013)
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