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"Efficient VaR and CVaR Measurement via Stochastic Kriging."

Xi Chen, Kyoung-Kuk Kim (2016)

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DOI: 10.1287/IJOC.2016.0705

access: closed

type: Journal Article

metadata version: 2020-03-15

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Xi Chen, Kyoung-Kuk Kim:
Efficient VaR and CVaR Measurement via Stochastic Kriging. INFORMS J. Comput. 28(4): 629-644 (2016)

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