"Deep learning super-resolution electron microscopy based on deep residual ..."

Jia Wang et al. (2021)

> Home

Details and statistics

DOI: 10.1002/IMA.22588

access: closed

type: Journal Article

metadata version: 2021-12-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/imst/WangLWG21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/imst/WangLWG21
Jia Wang, Chuwen Lan, Caiyong Wang, Zehua Gao:
Deep learning super-resolution electron microscopy based on deep residual attention network. Int. J. Imaging Syst. Technol. 31(4): 2158-2169 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.