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"Beam profiling by vibrating knife edge: Implications for near-field ..."
A. Korpel, D. J. Mehrl, S. Samson (1990)
- A. Korpel, D. J. Mehrl, S. Samson:
Beam profiling by vibrating knife edge: Implications for near-field optical scanning microscopy. Int. J. Imaging Syst. Technol. 2(3): 203-208 (1990)
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