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"Enabling Reliability-Driven Optimization Selection with Gate Graph ..."

Jiang Wu et al. (2020)

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DOI: 10.1142/S0218194020400240

access: closed

type: Journal Article

metadata version: 2021-02-26

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  dblp key:
  - journals/ijseke/WuXMZZ20
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  persistent URL:
  - https://dblp.org/rec/journals/ijseke/WuXMZZ20
Jiang Wu, Jianjun Xu, Xiankai Meng, Haoyu Zhang, Zhuo Zhang:
Enabling Reliability-Driven Optimization Selection with Gate Graph Attention Neural Network. Int. J. Softw. Eng. Knowl. Eng. 30(11&12): 1641-1665 (2020)

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