"PCB Defect Detection Based on Improved Deep Learning Model."

Shih-Hsien Tseng, Chi Kuo (2024)

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DOI: 10.1142/S0218001424540144

access: closed

type: Journal Article

metadata version: 2024-09-20

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Shih-Hsien Tseng, Chi Kuo:
PCB Defect Detection Based on Improved Deep Learning Model. Int. J. Pattern Recognit. Artif. Intell. 38(11): 2454014:1-2454014:25 (2024)

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