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"Reliability assessment of high-Quality new products with data scarcity."

Cai Wen Zhang, Rong Pan, Thong Ngee Goh (2021)

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DOI: 10.1080/00207543.2020.1758355

access: closed

type: Journal Article

metadata version: 2022-02-01

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  - journals/ijpr/ZhangPG21
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  - https://dblp.org/rec/journals/ijpr/ZhangPG21
Cai Wen Zhang, Rong Pan, Thong Ngee Goh:
Reliability assessment of high-Quality new products with data scarcity. Int. J. Prod. Res. 59(14): 4175-4187 (2021)

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