"Few-shot learning for defect detection in manufacturing."

Patrik Zajec et al. (2024)

> Home

Details and statistics

DOI: 10.1080/00207543.2024.2316279

access: open

type: Journal Article

metadata version: 2024-12-09

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ijpr/ZajecRTFKFM24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijpr/ZajecRTFKFM24
Patrik Zajec, Joze M. Rozanec, Spyros Theodoropoulos, Mihail Fontul, Erik Koehorst, Blaz Fortuna, Dunja Mladenic:
Few-shot learning for defect detection in manufacturing. Int. J. Prod. Res. 62(19): 6979-6998 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.