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"A data-driven method for enhancing the image-based automatic inspection of ..."
Junlong Chen, Zijun Zhang, Feng Wu (2021)
- Junlong Chen, Zijun Zhang, Feng Wu:
A data-driven method for enhancing the image-based automatic inspection of IC wire bonding defects. Int. J. Prod. Res. 59(16): 4779-4793 (2021)
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