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"Fan-in analysis of a leaky integrator circuit using charge transfer synapses."

Thomas Dowrick, Liam McDaid, Stephen Hall (2018)

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DOI: 10.1016/J.NEUCOM.2018.06.065

access: closed

type: Journal Article

metadata version: 2018-09-07

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  - https://dblp.org/rec/journals/ijon/DowrickMH18
Thomas Dowrick, Liam McDaid, Stephen Hall:
Fan-in analysis of a leaky integrator circuit using charge transfer synapses. Neurocomputing 314: 78-85 (2018)

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