"In-situ infrared detection and heating of metallic phase of silicon during ..."

Lei Dong, John A. Patten, Jimmie A. Miller (2005)

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DOI: 10.1504/IJMTM.2005.007701

access: closed

type: Journal Article

metadata version: 2020-06-04

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Lei Dong, John A. Patten, Jimmie A. Miller:
In-situ infrared detection and heating of metallic phase of silicon during scratching test. Int. J. Manuf. Technol. Manag. 7(5/6): 530-539 (2005)

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