"A new fault diagnosis method for cold test based on frequency analysis."

Li Wei, Zhang Kun, Chen Xi (2013)

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DOI: 10.1504/IJMIC.2013.052330

access: closed

type: Journal Article

metadata version: 2020-09-17

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Li Wei, Zhang Kun, Chen Xi:
A new fault diagnosis method for cold test based on frequency analysis. Int. J. Model. Identif. Control. 18(2): 146-157 (2013)

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