"Simulation of near-tip crack behaviour and its correlation to fatigue ..."

Lei Wang et al. (2008)

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DOI: 10.1504/IJMIC.2008.021777

access: closed

type: Journal Article

metadata version: 2020-09-17

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Lei Wang, Yongkang Chen, William Tiu, Yigeng Xu:
Simulation of near-tip crack behaviour and its correlation to fatigue crack growth with a modified strip-yield model. Int. J. Model. Identif. Control. 5(1): 77-91 (2008)

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