"Exploring the potential of deep learning and machine learning techniques ..."

Kenan Ince (2024)

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DOI: 10.1007/S10207-023-00783-Y

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type: Journal Article

metadata version: 2024-05-07

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Kenan Ince:
Exploring the potential of deep learning and machine learning techniques for randomness analysis to enhance security on IoT. Int. J. Inf. Sec. 23(2): 1117-1130 (2024)

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