"Reference-Free Machine Vision Inspection of semiconductor die Images."

Ada N. Y. Ng et al. (2009)

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DOI: 10.1142/S021946780900337X

access: closed

type: Journal Article

metadata version: 2020-03-24

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Ada N. Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S. M. Fung, W. H. Leung:
Reference-Free Machine Vision Inspection of semiconductor die Images. Int. J. Image Graph. 9(1): 133-152 (2009)

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