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"Technology Readiness in the Quality-value-loyalty Chain."

Wan-I Lee et al. (2009)

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DOI: —

access: closed

type: Journal Article

metadata version: 2022-02-28

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  dblp key:
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  - https://dblp.org/rec/journals/ijebm/LeeCCC09
Wan-I Lee, Yen-Ting Helena Chiu, Min-Huei Chiang, Chun-Chen Chiu:
Technology Readiness in the Quality-value-loyalty Chain. Int. J. Electron. Bus. Manag. 7(2): 112-127 (2009)

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