"Defect-tolerant nanoelectronic pattern classifiers."

Jung Hoon Lee, Konstantin K. Likharev (2007)

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DOI: 10.1002/CTA.410

access: closed

type: Journal Article

metadata version: 2020-05-11

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Jung Hoon Lee, Konstantin K. Likharev:
Defect-tolerant nanoelectronic pattern classifiers. Int. J. Circuit Theory Appl. 35(3): 239-264 (2007)

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