"A 5.25-V-tolerant bidirectional I/O circuit in a 28-nm CMOS process."

Keun-Seon Ahn, Jaewoo Park, Changsik Yoo (2015)

> Home

Details and statistics

DOI: 10.1002/CTA.1981

access: closed

type: Journal Article

metadata version: 2020-05-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijcta/AhnPY15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcta/AhnPY15
Keun-Seon Ahn, Jaewoo Park, Changsik Yoo:
A 5.25-V-tolerant bidirectional I/O circuit in a 28-nm CMOS process. Int. J. Circuit Theory Appl. 43(6): 822-828 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.