"The PIC-TDD Framework of Test Data Design for Pattern Recognition Systems."

Xiangdong Wang et al. (2014)

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DOI: 10.4018/IJAPUC.2014100104

access: closed

type: Journal Article

metadata version: 2020-09-29

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Xiangdong Wang, Ying Yang, Hong Liu, Yueliang Qian:
The PIC-TDD Framework of Test Data Design for Pattern Recognition Systems. Int. J. Adv. Pervasive Ubiquitous Comput. 6(4): 43-62 (2014)

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