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"Fast and automatic security test on cryptographic ICs against fault ..."
Cuiping Shao, Huiyun Li, Jianbin Zhou (2017)
- Cuiping Shao, Huiyun Li, Jianbin Zhou:
Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test. IET Inf. Secur. 11(6): 312-318 (2017)
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