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"Deterministic built-in self-test using multiple linear feedback shift ..."

Wang-Dauh Tseng, Lung-Jen Lee, Rung-Bin Lin (2010)

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DOI: 10.1049/IET-CDT.2009.0092

access: closed

type: Journal Article

metadata version: 2020-07-14

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Wang-Dauh Tseng, Lung-Jen Lee, Rung-Bin Lin:
Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction. IET Comput. Digit. Tech. 4(4): 317-324 (2010)

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