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"Simultaneous capture and shift power reduction test pattern generator for ..."

H.-T. Lin, J. C.-M. Li (2008)

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DOI: 10.1049/IET-CDT:20070088

access: closed

type: Journal Article

metadata version: 2020-07-14

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H.-T. Lin, J. C.-M. Li:
Simultaneous capture and shift power reduction test pattern generator for scan testing. IET Comput. Digit. Tech. 2(2): 132-141 (2008)

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