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"Deterministic logic BIST for transition fault testing."

Valentin Gherman et al. (2007)

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DOI: 10.1049/IET-CDT:20060131

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/GhermanWSG07
Valentin Gherman, Hans-Joachim Wunderlich, Jürgen Schlöffel, Michael Garbers:
Deterministic logic BIST for transition fault testing. IET Comput. Digit. Tech. 1(3): 180-186 (2007)

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