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"Adjacency criticality: a simple yet effective metric for statistical ..."

Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji (2019)

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DOI: 10.1049/IET-CDS.2018.5616

access: closed

type: Journal Article

metadata version: 2020-09-10

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Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji:
Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits. IET Circuits Devices Syst. 13(7): 979-987 (2019)

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