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"Fast and accurate estimation of SRAM read and hold failure probability ..."

Ik Joon Chang et al. (2010)

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DOI: 10.1049/IET-CDS.2010.0137

access: closed

type: Journal Article

metadata version: 2020-09-10

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Ik Joon Chang, Jongsun Park, Kunhyuk Kang, Kaushik Roy:
Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling. IET Circuits Devices Syst. 4(6): 469-478 (2010)

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