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"Impact of receptacle degradation and loose connection on signal integrity ..."

Hafiz Muhammad Bilal et al. (2020)

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DOI: 10.1049/IET-CDS.2020.0185

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/iet-cds/BilalWGU20
Hafiz Muhammad Bilal, Ziren Wang, Jinchun Gao, Junaid Ahmed Uqaili:
Impact of receptacle degradation and loose connection on signal integrity and electrical performance repeatability. IET Circuits Devices Syst. 14(7): 1012-1017 (2020)

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