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"Scalable model for predicting the effect of negative bias temperature ..."
Sarvesh Bhardwaj et al. (2008)
- Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao, Sarma B. K. Vrudhula:
Scalable model for predicting the effect of negative bias temperature instability for reliable design. IET Circuits Devices Syst. 2(4): 361-371 (2008)
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