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"RF performance reliability of power N-LDMOS under pulsed-RF aging life ..."

Mohamed Ali Belaïd, Ahmed Almusallam, Mohamed Masmoudi (2020)

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DOI: 10.1049/IET-CDS.2019.0552

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - journals/iet-cds/BelaidAM20
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  - https://dblp.org/rec/journals/iet-cds/BelaidAM20
Mohamed Ali Belaïd, Ahmed Almusallam, Mohamed Masmoudi:
RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band. IET Circuits Devices Syst. 14(6): 805-810 (2020)

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