"Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 ..."

Ryuichi Nakajima et al. (2024)

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DOI: 10.1587/TRANSELE.2023CDP0004

access: closed

type: Journal Article

metadata version: 2025-01-19

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Ryuichi Nakajima, Takafumi Ito, Shotaro Sugitani, Tomoya Kii, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard:
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies. IEICE Trans. Electron. 107(7): 191-200 (2024)

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