"High-Level Test Generation for Asynchronous Circuits from Signal ..."

Eunjung Oh et al. (2002)

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DOI: —

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type: Journal Article

metadata version: 2021-06-09

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Eunjung Oh, Soo-Hyun Kim, Dong-Ik Lee, Ho-Yong Choi:
High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 85-A(12): 2674-2683 (2002)

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