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"Improving Test Coverage by Measuring Path Delay Time Including ..."

Wenpo Zhang, Kazuteru Namba, Hideo Ito (2013)

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DOI: 10.1587/TRANSINF.E96.D.1219

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/ZhangNI13
Wenpo Zhang, Kazuteru Namba, Hideo Ito:
Improving Test Coverage by Measuring Path Delay Time Including Transmission Time of FF. IEICE Trans. Inf. Syst. 96-D(5): 1219-1222 (2013)

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