"X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability."

Gang Zeng, Hideo Ito (2005)

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DOI: 10.1093/IETISY/E88-D.7.1662

access: closed

type: Journal Article

metadata version: 2020-04-11

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Gang Zeng, Hideo Ito:
X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability. IEICE Trans. Inf. Syst. 88-D(7): 1662-1670 (2005)

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